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Polycrystalline Silicon Wafer For Solar Panel

4" 8" 12" 200um full square polycrystal multicrystal multicrystalline silicon wafer/ slice plate polycrystalline silicon wafer 1.8" monocrystalline silicon wafer 2.diamond wire sawed monocrystal silicon wafer 3.full square polycrystalline silicon wafer Standard size:8" or 156x156mm Standard thickness:200mm+/-20um

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Description

4" 8" 12" 200um full square polycrystal multicrystal multicrystalline silicon wafer/ slice plate polycrystalline silicon wafer

1.8" monocrystalline silicon wafer 2.diamond wire sawed monocrystal silicon wafer 3.full square polycrystalline silicon wafer

Standard size:8" or 156x156mm

Standard thickness:200mm+/-20um

Specification

MATERIAL PROPERTIES
PROPERTY	SPECIFICATION A	REFERENCED STANDARD A
GROWTH METHOD	CZ
CRYSTAL ORIENTATION	<100>±2º	ASTM F26
DONOR TYPE	P/boron	ASTM F42
OXYGEN CONCERTRATION	≤1.0x10¹⁸ atoms/cm3	ASTM F1188 measured on center
CRABON CONCENTRATION	≤5.0x10¹⁶ atoms/cm3	ASTM F1391 measured on center of slug
DISLOCATION DENSITY	≤3000pcs/cm3	ASTM F47-88 measured on slug in ingot tail
ELECTRICAL PROPERTIES
RESISITIVITY	1.0-3.0ohm-cm	ASTM F43
LIFETIME	≥10us	≥10us
GEOMETRY
GEOMETRY	SQUARE
THICKNESS	180um±20um	ASTM F533/EDGE 6MM 4, CENTER 1
TTV	≤30um	ASTM F567/EDGE 6MM 4, CENTER 1
DIMENSION	156±0.5um
SAW MARKS	depth≤15um, depth≤15um	ASTM F567
SURFACE QUALITY	Cleaned, no grease stains	Profilometer/sj-210
EDGE CHIPPING	depth≤0.3mm,length≤0.5mm	By sight
INDENTATION	Depth≤0.3um, length≤0.5mm, no V shape cave, total≤2	By sight
BOW	<40um	Astm f657;by non-contact capacitive
ROUGHNESS(RA)	<1.0um	Profilometer/sj-210
PACKAGE AND LABELS
PACKAGE	400PCS/PACKAGE	100PCS/BAG
LABELS	PART NO. P.O. NO. NO OF WAFER, DIMENSION	TEMP, HUMIDITY

Populāri tagi: polycrystalline silicon wafer for solar panel

Pāri:Polikristāliskā silīcija 6n/9n tīrība

Nākamo:Polikristāliskā pusvadītāju silīcija vafele

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